[PATCH 3/5] memtest: remove memtest command

[Alexander Aring <alex.aring@gmail.com>]

Remove memtest command.

Signed-off-by: Alexander Aring <alex.aring@gmail.com>
---
 commands/Kconfig   |   9 --
 commands/Makefile  |   1 -
 commands/memtest.c | 351 -----------------------------------------------------
 3 files changed, 361 deletions(-)
 delete mode 100644 commands/memtest.c

diff --git a/commands/Kconfig b/commands/Kconfig
index 6a759ce..add547f 100644
--- a/commands/Kconfig
+++ b/commands/Kconfig
@@ -561,15 +561,6 @@ config CMD_NANDTEST
 	select PARTITION_NEED_MTD
 	prompt "nandtest"
 
-config CMD_MTEST
-	tristate
-	prompt "mtest"
-
-config CMD_MTEST_ALTERNATIVE
-	bool
-	depends on CMD_MTEST
-	prompt "alternative mtest implementation"
-
 endmenu
 
 menu "video command"
diff --git a/commands/Makefile b/commands/Makefile
index 953ecc2..9d34a56 100644
--- a/commands/Makefile
+++ b/commands/Makefile
@@ -13,7 +13,6 @@ obj-$(CONFIG_CMD_MW)		+= mw.o
 obj-$(CONFIG_CMD_MEMCMP)	+= memcmp.o
 obj-$(CONFIG_CMD_MEMCPY)	+= memcpy.o
 obj-$(CONFIG_CMD_MEMSET)	+= memset.o
-obj-$(CONFIG_CMD_MTEST)		+= memtest.o
 obj-$(CONFIG_CMD_EDIT)		+= edit.o
 obj-$(CONFIG_CMD_EXEC)		+= exec.o
 obj-$(CONFIG_CMD_SLEEP)		+= sleep.o
diff --git a/commands/memtest.c b/commands/memtest.c
deleted file mode 100644
index 2d64d00..0000000
--- a/commands/memtest.c
+++ /dev/null
@@ -1,351 +0,0 @@
-/*
- * mtest - Perform a memory test
- *
- * (C) Copyright 2000
- * Wolfgang Denk, DENX Software Engineering, wd@denx.de.
- *
- * See file CREDITS for list of people who contributed to this
- * project.
- *
- * This program is free software; you can redistribute it and/or
- * modify it under the terms of the GNU General Public License as
- * published by the Free Software Foundation; either version 2 of
- * the License, or (at your option) any later version.
- *
- * This program is distributed in the hope that it will be useful,
- * but WITHOUT ANY WARRANTY; without even the implied warranty of
- * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE.  See the
- * GNU General Public License for more details.
- *
- */
-
-#include <common.h>
-#include <command.h>
-#include <types.h>
-
-/*
- * Perform a memory test. A more complete alternative test can be
- * configured using CONFIG_CMD_MTEST_ALTERNATIVE. The complete test
- * loops until interrupted by ctrl-c or by a failure of one of the
- * sub-tests.
- */
-#ifdef CONFIG_CMD_MTEST_ALTERNATIVE
-static int mem_test(ulong _start, ulong _end, ulong pattern_unused)
-{
-	vu_long *start = (vu_long *)_start;
-	vu_long *end   = (vu_long *)_end;
-	vu_long *addr;
-	ulong	val;
-	ulong	readback;
-	vu_long	addr_mask;
-	vu_long	offset;
-	vu_long	test_offset;
-	vu_long	pattern;
-	vu_long	temp;
-	vu_long	anti_pattern;
-	vu_long	num_words;
-#ifdef CFG_MEMTEST_SCRATCH
-	vu_long *dummy = (vu_long*)CFG_MEMTEST_SCRATCH;
-#else
-	vu_long *dummy = start;
-#endif
-	int	j;
-	int iterations = 1;
-
-	static const ulong bitpattern[] = {
-		0x00000001,	/* single bit */
-		0x00000003,	/* two adjacent bits */
-		0x00000007,	/* three adjacent bits */
-		0x0000000F,	/* four adjacent bits */
-		0x00000005,	/* two non-adjacent bits */
-		0x00000015,	/* three non-adjacent bits */
-		0x00000055,	/* four non-adjacent bits */
-		0xaaaaaaaa,	/* alternating 1/0 */
-	};
-
-	/* XXX: enforce alignment of start and end? */
-	for (;;) {
-		if (ctrlc()) {
-			putchar ('\n');
-			return 1;
-		}
-
-		printf("Iteration: %6d\r", iterations);
-		iterations++;
-
-		/*
-		 * Data line test: write a pattern to the first
-		 * location, write the 1's complement to a 'parking'
-		 * address (changes the state of the data bus so a
-		 * floating bus doen't give a false OK), and then
-		 * read the value back. Note that we read it back
-		 * into a variable because the next time we read it,
-		 * it might be right (been there, tough to explain to
-		 * the quality guys why it prints a failure when the
-		 * "is" and "should be" are obviously the same in the
-		 * error message).
-		 *
-		 * Rather than exhaustively testing, we test some
-		 * patterns by shifting '1' bits through a field of
-		 * '0's and '0' bits through a field of '1's (i.e.
-		 * pattern and ~pattern).
-		 */
-		addr = start;
-		/* XXX */
-		if (addr == dummy) ++addr;
-		for (j = 0; j < sizeof(bitpattern)/sizeof(bitpattern[0]); j++) {
-		    val = bitpattern[j];
-		    for(; val != 0; val <<= 1) {
-			*addr  = val;
-			*dummy  = ~val; /* clear the test data off of the bus */
-			readback = *addr;
-			if(readback != val) {
-			     printf ("FAILURE (data line): "
-				"expected 0x%08lx, actual 0x%08lx at address 0x%p\n",
-					  val, readback, addr);
-			}
-			*addr  = ~val;
-			*dummy  = val;
-			readback = *addr;
-			if(readback != ~val) {
-			    printf ("FAILURE (data line): "
-				"Is 0x%08lx, should be 0x%08lx at address 0x%p\n",
-					readback, ~val, addr);
-			}
-		    }
-		}
-
-		/*
-		 * Based on code whose Original Author and Copyright
-		 * information follows: Copyright (c) 1998 by Michael
-		 * Barr. This software is placed into the public
-		 * domain and may be used for any purpose. However,
-		 * this notice must not be changed or removed and no
-		 * warranty is either expressed or implied by its
-		 * publication or distribution.
-		 */
-
-		/*
-		 * Address line test
-		 *
-		 * Description: Test the address bus wiring in a
-		 *              memory region by performing a walking
-		 *              1's test on the relevant bits of the
-		 *              address and checking for aliasing.
-		 *              This test will find single-bit
-		 *              address failures such as stuck -high,
-		 *              stuck-low, and shorted pins. The base
-		 *              address and size of the region are
-		 *              selected by the caller.
-		 *
-		 * Notes:	For best results, the selected base
-		 *              address should have enough LSB 0's to
-		 *              guarantee single address bit changes.
-		 *              For example, to test a 64-Kbyte
-		 *              region, select a base address on a
-		 *              64-Kbyte boundary. Also, select the
-		 *              region size as a power-of-two if at
-		 *              all possible.
-		 *
-		 * Returns:     0 if the test succeeds, 1 if the test fails.
-		 *
-		 * ## NOTE ##	Be sure to specify start and end
-		 *              addresses such that addr_mask has
-		 *              lots of bits set. For example an
-		 *              address range of 01000000 02000000 is
-		 *              bad while a range of 01000000
-		 *              01ffffff is perfect.
-		 */
-		addr_mask = ((ulong)end - (ulong)start)/sizeof(vu_long);
-		pattern = (vu_long) 0xaaaaaaaa;
-		anti_pattern = (vu_long) 0x55555555;
-
-		debug("%s:%d: addr mask = 0x%.8lx\n",
-			__FUNCTION__, __LINE__,
-			addr_mask);
-		/*
-		 * Write the default pattern at each of the
-		 * power-of-two offsets.
-		 */
-		for (offset = 1; (offset & addr_mask) != 0; offset <<= 1)
-			start[offset] = pattern;
-
-		/*
-		 * Check for address bits stuck high.
-		 */
-		test_offset = 0;
-		start[test_offset] = anti_pattern;
-
-		for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) {
-		    temp = start[offset];
-		    if (temp != pattern) {
-			printf ("\nFAILURE: Address bit stuck high @ 0x%.8lx:"
-				" expected 0x%.8lx, actual 0x%.8lx\n",
-				(ulong)&start[offset], pattern, temp);
-			return 1;
-		    }
-		}
-		start[test_offset] = pattern;
-
-		/*
-		 * Check for addr bits stuck low or shorted.
-		 */
-		for (test_offset = 1; (test_offset & addr_mask) != 0; test_offset <<= 1) {
-		    start[test_offset] = anti_pattern;
-
-		    for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) {
-			temp = start[offset];
-			if ((temp != pattern) && (offset != test_offset)) {
-			    printf ("\nFAILURE: Address bit stuck low or shorted @"
-				" 0x%.8lx: expected 0x%.8lx, actual 0x%.8lx\n",
-				(ulong)&start[offset], pattern, temp);
-			    return 1;
-			}
-		    }
-		    start[test_offset] = pattern;
-		}
-
-		/*
-		 * Description: Test the integrity of a physical
-		 *		memory device by performing an
-		 *		increment/decrement test over the
-		 *		entire region. In the process every
-		 *		storage bit in the device is tested
-		 *		as a zero and a one. The base address
-		 *		and the size of the region are
-		 *		selected by the caller.
-		 *
-		 * Returns:     0 if the test succeeds, 1 if the test fails.
-		 */
-		num_words = ((ulong)end - (ulong)start)/sizeof(vu_long) + 1;
-
-		/*
-		 * Fill memory with a known pattern.
-		 */
-		for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
-			start[offset] = pattern;
-		}
-
-		/*
-		 * Check each location and invert it for the second pass.
-		 */
-		for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
-		    temp = start[offset];
-		    if (temp != pattern) {
-			printf ("\nFAILURE (read/write) @ 0x%.8lx:"
-				" expected 0x%.8lx, actual 0x%.8lx)\n",
-				(ulong)&start[offset], pattern, temp);
-			return 1;
-		    }
-
-		    anti_pattern = ~pattern;
-		    start[offset] = anti_pattern;
-		}
-
-		/*
-		 * Check each location for the inverted pattern and zero it.
-		 */
-		for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
-		    anti_pattern = ~pattern;
-		    temp = start[offset];
-		    if (temp != anti_pattern) {
-			printf ("\nFAILURE (read/write): @ 0x%.8lx:"
-				" expected 0x%.8lx, actual 0x%.8lx)\n",
-				(ulong)&start[offset], anti_pattern, temp);
-			return 1;
-		    }
-		    start[offset] = 0;
-		}
-	}
-
-}
-#else
-static int mem_test(ulong _start, ulong _end, ulong pattern)
-{
-	vu_long	*addr;
-	vu_long *start = (vu_long *)_start;
-	vu_long *end   = (vu_long *)_end;
-	ulong	val;
-	ulong	readback;
-	ulong	incr;
-	int rcode;
-
-	incr = 1;
-	for (;;) {
-		if (ctrlc()) {
-			putchar('\n');
-			return 1;
-		}
-
-		printf ("\rPattern 0x%08lX  Writing..."
-			"%12s"
-			"\b\b\b\b\b\b\b\b\b\b",
-			pattern, "");
-
-		for (addr=start,val=pattern; addr<end; addr++) {
-			*addr = val;
-			val  += incr;
-		}
-
-		puts ("Reading...");
-
-		for (addr=start,val=pattern; addr<end; addr++) {
-			readback = *addr;
-			if (readback != val) {
-				printf ("\nMem error @ 0x%08X: "
-					"found 0x%08lX, expected 0x%08lX\n",
-					(uint)addr, readback, val);
-				rcode = 1;
-			}
-			val += incr;
-		}
-
-		/*
-		 * Flip the pattern each time to make lots of zeros and
-		 * then, the next time, lots of ones.  We decrement
-		 * the "negative" patterns and increment the "positive"
-		 * patterns to preserve this feature.
-		 */
-		if(pattern & 0x80000000) {
-			pattern = -pattern;	/* complement & increment */
-		}
-		else {
-			pattern = ~pattern;
-		}
-		incr = -incr;
-	}
-	return rcode;
-}
-#endif
-
-static int do_mem_mtest(int argc, char *argv[])
-{
-	ulong start, end, pattern = 0;
-
-	if (argc < 3)
-		return COMMAND_ERROR_USAGE;
-
-	start = simple_strtoul(argv[1], NULL, 0);
-	end = simple_strtoul(argv[2], NULL, 0);
-
-	if (argc > 3)
-		pattern = simple_strtoul(argv[3], NULL, 0);
-
-	printf ("Testing 0x%08x ... 0x%08x:\n", (uint)start, (uint)end);
-	
-	return mem_test(start, end, pattern);
-}
-
-static const __maybe_unused char cmd_mtest_help[] =
-"Usage: <start> <end> "
-#ifdef CONFIG_CMD_MTEST_ALTERNATIVE
-"[pattern]"
-#endif
-"\nsimple RAM read/write test\n";
-
-BAREBOX_CMD_START(mtest)
-	.cmd		= do_mem_mtest,
-	.usage		= "simple RAM test",
-	BAREBOX_CMD_HELP(cmd_mtest_help)
-BAREBOX_CMD_END
-
-- 
1.8.3


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